X-ray nanodiffraction of tilted domains in a poled epitaxial BiFeO3 thin film
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چکیده
S. O. Hruszkewycz, C. M. Folkman, M. J. Highland, M. V. Holt, S. H. Baek, S. K. Streiffer, P. Baldo, C. B. Eom, and P. H. Fuoss Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439, USA
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تاریخ انتشار 2013